[IEEE 2018 IEEE 9th International Conference on Biometrics Theory, Applications and Systems (BTAS) - Redondo Beach, CA, USA (2018.10.22-2018.10.25)] 2018 IEEE 9th International Conference on Biometrics Theory, Applications and Systems (BTAS) - A Likelihood Ratio Classifier for Histogram Features
Veldhuis, Raymond, Raja, Kiran, Ramachandra, RaghavendraYear:
2018
Language:
english
DOI:
10.1109/BTAS.2018.8698573
File:
PDF, 33 KB
english, 2018