A Substrate-Dissipating (SD) Mechanism for a Ruggedness-Improved SOI LDMOS Device
Wang, Bing, Wang, Zhigang, Kuo, James B.Volume:
6
Year:
2018
Language:
english
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/JEDS.2018.2831278
File:
PDF, 2.22 MB
english, 2018