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[IEEE 2018 International Wafer Level Packaging Conference (IWLPC) - San Jose, CA (2018.10.23-2018.10.25)] 2018 International Wafer Level Packaging Conference (IWLPC) - Degas Module Thermal Architecture, Variable Wafer Delays, and Throughput, Productivity, and Consistency in Fan-Out Packaging Barrier/Seed Layer PVD
Werbaneth, Paul, Runstadler, Billy, North, Sam, Kudriavtsev, Vladimir, Krishnaswami, Sriram, Danh, Luy, Bluck, Terry, Blonigan, CamronYear:
2018
Language:
english
DOI:
10.23919/IWLPC.2018.8573295
File:
PDF, 34 KB
english, 2018