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Sensor layout optimization by integrating Bayesian approach to diagnose multi-station assembly processes
He, Kang, Jia, Minping, Liu, Conghu, Zhao, ZhuanzheVolume:
146
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2019.06.021
Date:
November, 2019
File:
PDF, 593 KB
english, 2019