Precision Permittivity Measurement for Low-Loss Thin Planar...

Journal of Manufacturing and Materials Processing 2018 / 12 Vol. 2; Iss. 4

Precision Permittivity Measurement for Low-Loss Thin Planar Materials Using Large Coaxial Probe from 1 to 400 MHz

You, Kok Yeow, Sim, Man Seng
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
2
Language:
english
Journal:
Journal of Manufacturing and Materials Processing
DOI:
10.3390/jmmp2040081
Date:
December, 2018
File:
PDF, 5.51 MB
english, 2018
Conversion to is in progress
Conversion to is failed