Temperature and Thickness Dependent Electrical Breakdown...

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Temperature and Thickness Dependent Electrical Breakdown Modulated by Coupling model of Charge Transport and Molecular Chain Dynamics

Xie, Dongri, Min, Daomin, Yang, Liuqing, Li, Shengtao
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Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/ab257a
Date:
May, 2019
File:
PDF, 1.62 MB
2019
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