Characterization of SiO2/4H-SiC Interfaces in 4H-SiC...

Energies 2019 / 06 Vol. 12; Iss. 12

Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review

Fiorenza, Patrick, Giannazzo, Filippo, Roccaforte, Fabrizio
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Volume:
12
Language:
english
Journal:
Energies
DOI:
10.3390/en12122310
Date:
June, 2019
File:
PDF, 3.72 MB
english, 2019
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