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[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Test-Driven Anonymization for Artificial Intelligence
Augusto, Cristian, Moran, Jesus, De La Riva, Claudio, Tuya, JavierYear:
2019
Language:
english
DOI:
10.1109/AITest.2019.00011
File:
PDF, 33 KB
english, 2019