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[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Influence-Directed Explanations for Deep Convolutional Networks
Leino, Klas, Sen, Shayak, Datta, Anupam, Fredrikson, Matt, Li, LinyiYear:
2018
Language:
english
DOI:
10.1109/TEST.2018.8624792
File:
PDF, 34 KB
english, 2018