Investigation of Characteristics of Thick Diffraction...

Optoelectronics, Instrumentation and Data Processing 2019 / 1 Vol. 55; Iss. 1

Investigation of Characteristics of Thick Diffraction Gratings by the Method of Laser Heterodyne Tomography

Tverdokhleb, P. E., Shchepetkin, Yu. A., Steinberg, I. Sh.
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Volume:
55
Language:
english
Journal:
Optoelectronics, Instrumentation and Data Processing
DOI:
10.3103/S8756699019010047
Date:
January, 2019
File:
PDF, 321 KB
english, 2019
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