Chemical Identification of Interlayer Contaminants within van der Waals Heterostructures
Schwartz, Jeffrey J., Chuang, Hsun-Jen, Rosenberger, Matthew R., Sivaram, Saujan V., McCreary, Kathleen M., Jonker, Berend T., Centrone, AndreaLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.9b06594
Date:
June, 2019
File:
PDF, 744 KB
english, 2019