Measurement of yield and spectrum of secondary electron...

Review of Scientific Instruments 2019 / 06 Vol. 90; Iss. 6

Measurement of yield and spectrum of secondary electron emission and their characteristics under modification of conductive materials

He, Jialong, Yang, Jie, Peng, Yufei, Long, Jidong, Yang, Zhen, Wang, Tao, Liu, Ping, Li, Jie, Zheng, Le, Dong, Pan, Li, Xi, Lan, Chaohui, Zhao, Wei, Liu, Erxiang, Shi, Jinshui
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Volume:
90
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5053965
Date:
June, 2019
File:
PDF, 3.81 MB
english, 2019
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