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Minority Carrier Trap in n-Type 4H–SiC Schottky Barrier Diodes
Capan, Ivana, Yamazaki, Yuichi, Oki, Yuya, Brodar, Tomislav, Makino, Takahiro, Ohshima, TakeshiVolume:
9
Language:
english
Journal:
Crystals
DOI:
10.3390/cryst9070328
Date:
June, 2019
File:
PDF, 1.59 MB
english, 2019