Photometric Redshift Analysis using Supervised Learning...

EPJ Web of Conferences 2019 Vol. 206

Photometric Redshift Analysis using Supervised Learning Algorithms and Deep Learning

Chong, De Wei, Kenny, Yang, Abel, Yang, A., Wang, W.Y., Ng, S.C.C., Chan, A.H., Oh, C.H., Phua, K.K.
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Volume:
206
Year:
2019
Language:
english
Journal:
EPJ Web of Conferences
DOI:
10.1051/epjconf/201920609006
File:
PDF, 399 KB
english, 2019
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