Impact of Electrical Stress on γ Ray irradiated Double...

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IEEE Transactions on Device and Materials Reliability 2019

Impact of Electrical Stress on γ Ray irradiated Double Polysilicon Self-Aligned (DPSA) PNP Bipolar Transistors

Zhang, Peijian, Zhu, Kunfeng, Chen, Wensuo, Tan, Kaizhou, Wu, Xue, Wen, Xianchao, Yu, Zhou, Li, Jing, Han, Weimin, Wang, Jianan, Zhong, Yi, Yang, Yonghui
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2923170
File:
PDF, 935 KB
english, 2019
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