Extended Methodologies for Using Extreme Value Statistic for SRAM Vmin
Pompl, Thomas, Henkel, Susanne, Stahl, Joachim, Ostermayr, MartinYear:
2019
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2019.2924076
File:
PDF, 1.03 MB
english, 2019