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Analysis of Variation and Ferroelectric Layer Thickness on Negative Capacitance Nanowire Field-Effect Transistor
Lee, Jang Kyu, Woo, Changbeom, Kim, Jongsu, Kang, Myounggon, Jeon, Jongwook, Shin, HyungcheolVolume:
19
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2019.17106
Date:
October, 2019
File:
PDF, 4.10 MB
english, 2019