[IEEE 2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia) - Niigata (2018.5.20-2018.5.24)] 2018 International Power Electronics Conference (IPEC-Niigata 2018 -ECCE Asia) - A Plotter-Based Automatic Measurement and Statistical Characterization of Multiple Discrete Power Devices
Shintani, Michihiro, Dauphin, Benjamin, Oishi, Kazuki, Hiromoto, Masayuki, Sato, TakashiYear:
2018
Language:
english
DOI:
10.23919/IPEC.2018.8507443
File:
PDF, 1.35 MB
english, 2018