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[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery
Mataev, Elnatan, Stathis, James, La Rosa, Giuseppe, Linder, Barry P.Year:
2019
DOI:
10.1109/IRPS.2019.8720442
File:
PDF, 824 KB
2019