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[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability
Hirler, A., Alsioufy, A., Biba, J., Lehndorff, T., Lipp, D., Lochner, H., Siddabathula, M., Simon, S., Sulima, T., Wiatr, M., Hansch, W.Year:
2019
DOI:
10.1109/IRPS.2019.8720536
File:
PDF, 407 KB
2019