Laue microdiffraction characterisation of as-cast and...

Philosophical Magazine 2019 / 08 Vol. 99; Iss. 15

Laue microdiffraction characterisation of as-cast and tensile deformed Al microwires

Deillon, L., Verheyden, S., Ferreira Sanchez, D., Van Petegem, S., Van Swygenhoven, H., Mortensen, A.
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Volume:
99
Language:
english
Journal:
Philosophical Magazine
DOI:
10.1080/14786435.2019.1605220
Date:
August, 2019
File:
PDF, 2.50 MB
english, 2019
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