Understanding the threshold voltage instability during...

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IEEE Electron Device Letters 2019

Understanding the threshold voltage instability during off-state stress in p-GaN HEMTs

Efthymiou, Loizos, Murukesan, Karthick, Longobardi, Giorgia, Udrea, Florin, Shibib, Ayman, Terrill, Kyle
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Year:
2019
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2925776
File:
PDF, 549 KB
english, 2019
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