[ACM Press The 5th ACM Workshop - Seoul, Republic of Korea (2019.06.21-2019.06.21)] The 5th ACM Workshop on Wearable Systems and Applications - WearSys '19 - Walk to Show Your Identity
Baek, Duin, Musale, Pratik, Ryoo, JihoonYear:
2019
Language:
english
DOI:
10.1145/3325424.3329666
File:
PDF, 1.76 MB
english, 2019