![](/img/cover-not-exists.png)
The Effect of Zirconium Doping on Solution-Processed Indium Oxide Thin Films Measured by a Novel Nondestructive Testing Method (Microwave Photoconductivity Decay)
Zhang, Jingying, Fu, Xiao, Zhou, Shangxiong, Ning, Honglong, Wang, Yiping, Guo, Dong, Cai, Wei, Liang, Zhihao, Yao, Rihui, Peng, JunbiaoVolume:
9
Language:
english
Journal:
Coatings
DOI:
10.3390/coatings9070426
Date:
July, 2019
File:
PDF, 4.02 MB
english, 2019