[IEEE 2019 IEEE International Conference On Artificial...

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[IEEE 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Newark, CA, USA (2019.4.4-2019.4.9)] 2019 IEEE International Conference On Artificial Intelligence Testing (AITest) - Neural Network Based Test Case Generation for Data-Flow Oriented Testing

Ji, Shunhui, Chen, Qin, Zhang, Pengcheng
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Year:
2019
Language:
english
DOI:
10.1109/AITest.2019.00-11
File:
PDF, 231 KB
english, 2019
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