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[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces
Ichiyama, Kiyotaka, Kusaka, Takashi, Ishida, MasahiroYear:
2018
DOI:
10.1109/test.2018.8624841
File:
PDF, 41 KB
2018