Measurement of Diffusion and Segregation in Semiconductor...

Measurement of Diffusion and Segregation in Semiconductor Quantum Dots and Quantum Wells by Transmission Electron Microscopy: A Guide

Walther, Thomas
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Volume:
9
Journal:
Nanomaterials
DOI:
10.3390/nano9060872
Date:
June, 2019
File:
PDF, 3.25 MB
2019
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