The effect of defect size on the quantitative estimation of defect depth using sonic infrared imaging
Obeidat, Omar, Yu, Qiuye, Favro, Lawrence, Han, XiaoyanVolume:
90
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.5078380
Date:
May, 2019
File:
PDF, 2.07 MB
english, 2019