[IEEE 2018 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS) - Hyderabad, India (2018.12.17-2018.12.19)] 2018 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS) - Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation

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