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[IEEE 2018 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS) - Hyderabad, India (2018.12.17-2018.12.19)] 2018 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS) - Correlation of Dynamic and Static Metrics of SRAM Cell under Time-Zero Variability and After NBTI Degradation
Chaudhari, Sarthak Prakash, Shaik, Jani Babu, Singhal, Sonal, Goel, NileshYear:
2018
Language:
english
DOI:
10.1109/iSES.2018.00028
File:
PDF, 270 KB
english, 2018