Defect energy level and transition mechanism of CuI thin...

Journal of Luminescence 2019 / 10 Vol. 214

Defect energy level and transition mechanism of CuI thin film by low-temperature spectrum

Zhang, KeXin, Wang, ShenWei, Bai, LiYuan, Wang, Yu, Ou, Kai, Zhang, YanWei, Yi, LiXin
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Volume:
214
Journal:
Journal of Luminescence
DOI:
10.1016/j.jlumin.2019.116522
Date:
October, 2019
File:
PDF, 2.67 MB
2019
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