![](/img/cover-not-exists.png)
Study on Impact of Parasitic Capacitance on Performance of Graded Channel Negative Capacitance SOI FET at High Temperature
Mehta, Hema, Kaur, HarsupreetVolume:
66
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2917775
Date:
July, 2019
File:
PDF, 3.38 MB
english, 2019