AN ASSESSMENT ON ELECTRICAL CHARACTERIZATION OF Ni/n-Si...

  • Main
  • 2018 / 12
  • AN ASSESSMENT ON ELECTRICAL CHARACTERIZATION OF Ni/n-Si...
Surface Review and Letters 2018 / 12

AN ASSESSMENT ON ELECTRICAL CHARACTERIZATION OF Ni/n-Si SCHOTTKY RECTIFIERS WITH AND WITHOUT Ta 2 O 5 INTERFACIAL OXIDE LAYER

NANDA KUMAR REDDY, N., ANANDA, P., VERMA, V. K., RAHIM BAKASH, K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X19500732
Date:
December, 2018
File:
PDF, 724 KB
english, 2018
Conversion to is in progress
Conversion to is failed