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Simulation Study for the Half-Life Measurement of 180mTa Using HPGe Detectors
Kim, G. W., Park, S. Y., Hahn, I. S., Kim, Y. D., Lee, M. H., Leonard, D. S., Lee, E. K., Kang, W. G., Sala, E., Kazalov, V.Volume:
75
Language:
english
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.75.32
Date:
July, 2019
File:
PDF, 1.58 MB
english, 2019