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Microstructure and Characterization of CuAlNi Shape Memory Thin Films
Kneissl, A.C., Kutschej, K., Wu, X.D.Volume:
8
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927602105034
Date:
August, 2002
File:
PDF, 224 KB
english, 2002