![](/img/cover-not-exists.png)
Critical thickness of strained Si1-xGex on Ge(111) and Ge-on-Si(111)
Alam, Md. Mahfuz, Wagatsuma, Youya, Okada, Kazuya, Hoshi, Yusuke, Yamada, Michihiro, HAMAYA, Kohei, SAWANO, KentarouLanguage:
english
Journal:
Applied Physics Express
DOI:
10.7567/1882-0786/ab2db8
Date:
June, 2019
File:
PDF, 782 KB
english, 2019