Improving reliability in NoCs by reconstructing location...

Microelectronics Journal 2019 / 08 Vol. 90

Improving reliability in NoCs by reconstructing location distribution of management cores

Fu, Fangfa, Lou, Binglei, Chen, Yukun, Wang, Jinxiang
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Volume:
90
Journal:
Microelectronics Journal
DOI:
10.1016/j.mejo.2019.06.001
Date:
August, 2019
File:
PDF, 1.15 MB
2019
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