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Quantitative analysis of dual whole-cell voltage-clamp determination of gap junctional conductance
H. V. M. Van Rijen, Ronald Wilders, Antoni C. G. Van Ginneken, Habo J. JongsmaVolume:
436
Language:
english
Pages:
11
DOI:
10.1007/s004240050615
Date:
April, 1998
File:
PDF, 727 KB
english, 1998