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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2019

Modeling and Detectability of Full Open Gate Defects in FinFET Technology

Forero, Freddy, Villacorta, Hector, Renovell, Michel, Champac, Victor
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Year:
2019
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2019.2918768
File:
PDF, 45 KB
english, 2019
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