[IEEE 2018 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Washington, DC, USA (2018.10.9-2018.10.11)] 2018 IEEE Applied Imagery Pattern Recognition Workshop (AIPR) - Integration of Deep Learning and Graph Theory for Analyzing Histopathology Whole-slide Images
Jung, Hyun, Suloway, Christian, Miao, Tianyi, Edmondson, Elijah F., Morcock, David R., Deleage, Claire, Liu, Yanling, Collins, Jack R., Lisle, CurtisYear:
2018
Language:
english
DOI:
10.1109/AIPR.2018.8707424
File:
PDF, 702 KB
english, 2018