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[IEEE 2019 IEEE 11th International Memory Workshop (IMW) - Monterey, CA, USA (2019.5.12-2019.5.15)] 2019 IEEE 11th International Memory Workshop (IMW) - Physical Origin of Excellent Data Retention over 10years at sub-$\mu \mathrm{A}$ Operation in AgW-Alloy Ionic Memory
Yamaguchi, Marina, Fujii, Shosuke, Yoshimura, Yoko, Nagasawa, Riki, Asayama, Yoshihiro, Shirakawa, Hiroki, Araidai, Masaaki, Shiraishi, Kenji, Nakayama, Takashi, Saitoh, MasumiYear:
2019
Language:
english
DOI:
10.1109/IMW.2019.8739678
File:
PDF, 686 KB
english, 2019