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[IEEE 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Xi'an, China (2019.6.12-2019.6.14)] 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Study of a phenomenon of high error WL in mixed read and program operations in 3-D NAND flash
Zhang, Xuhang, Ma, Dongfang, Lin, Weijie, Cheng, ZhiyuanYear:
2019
Language:
english
DOI:
10.1109/EDSSC.2019.8754491
File:
PDF, 266 KB
english, 2019