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[IEEE 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST) - Xi'an, China (2019.4.22-2019.4.27)] 2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST) - An Empirical Study on the Use of Defect Prediction for Test Case Prioritization
Paterson, David, Campos, Jose, Abreu, Rui, Kapfhammer, Gregory M., Fraser, Gordon, McMinn, PhilYear:
2019
Language:
english
DOI:
10.1109/ICST.2019.00041
File:
PDF, 49 KB
english, 2019