Improving Analytical Efficiency of EDS using a...

Microscopy and Microanalysis 2015 / 08 Vol. 21; Iss. S3

Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope

Sasaki, Takeo, Sawada, Hidetaka, Okunishi, Eiji, Jimbo, Yu, Iwasawa, Yorinobu, Miyatake, Koji, Yuasa, Shuichi, Kaneyama, Toshikatsu
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Volume:
21
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615010089
Date:
August, 2015
File:
PDF, 573 KB
2015
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