Chemical Identification of Interlayer Contaminants within...

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ACS Applied Materials & Interfaces 2019 / 06

Chemical Identification of Interlayer Contaminants within van der Waals Heterostructures

Schwartz, Jeffrey J., Chuang,  Hsun-Jen, Rosenberger, Matthew R., Sivaram, Saujan V., McCreary, Kathleen M., Jonker, Berend T., Centrone, Andrea
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Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.9b06594
Date:
June, 2019
File:
PDF, 744 KB
2019
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