[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaO x -based ReRAM
Fukuyama, Shouhei, Hayakawa, Atsuna, Yasuhara, Ryutaro, Matsuda, Shinpei, Kinoshita, Hiroshi, Takeuchi, KenYear:
2019
Language:
english
DOI:
10.1109/IRPS.2019.8720436
File:
PDF, 2.35 MB
english, 2019