[IEEE 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Geneva, Switzerland (2017.10.2-2017.10.6)] 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Total dose radiation hardening of MOS transistors by fluorine implantation
Shaw, Chris, Potter, Kenneth, Morgan, Katrina, Ashburn, Peter, de Groot, Kees, Redman-White, BillYear:
2017
Language:
english
DOI:
10.1109/RADECS.2017.8696125
File:
PDF, 535 KB
english, 2017