New Insight into Negative Bias Temperature Instability...

  • Main
  • 2019
  • New Insight into Negative Bias Temperature Instability...
IEEE Electron Device Letters 2019

New Insight into Negative Bias Temperature Instability Degradation during Self-heating in Nanoscale Bulk FinFETs

Son, Dokyun, Hong, Kyushik, Shim, Hyewon, Pae, Sangwoo, Shin, Hyungcheol
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2019
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2930077
File:
PDF, 352 KB
english, 2019
Conversion to is in progress
Conversion to is failed