[IEEE 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Florence, Italy (2019.3.25-2019.3.29)] 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation
Weller, Dennis D., Hefenbrock, Michael, Golanbari, Mohammad S., Beigl, Michael, Tahoori, Mehdi B.Year:
2019
DOI:
10.23919/DATE.2019.8714879
File:
PDF, 712 KB
2019