Theoretical investigation of the interface fluctuation...

Theoretical investigation of the interface fluctuation causing low channel conductivity at SiO 2 /SiC interfaces through the self-energy and average Green’s function

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Volume:
9
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.5098989
Date:
July, 2019
File:
PDF, 1018 KB
english, 2019
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