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[IEEE 2018 IEEE International Conference on Data Mining Workshops (ICDMW) - Singapore, Singapore (2018.11.17-2018.11.20)] 2018 IEEE International Conference on Data Mining Workshops (ICDMW) - End-to-End Deep Knowledge Tracing by Learning Binary Question-Embedding
Nakagawa, Hiromi, Iwasawa, Yusuke, Matsuo, YutakaYear:
2018
Language:
english
DOI:
10.1109/ICDMW.2018.00055
File:
PDF, 36 KB
english, 2018